Piezoelectric Properties of Pb1-xLax(Zr0.52Ti0.48)(1-x/4)O(3)Thin Films Studied by In Situ X-ray Diffraction


The piezoelectric properties of lanthanum-modified lead zirconate titanate Pb1-xLax(Zr0.52Ti0.48)(1-x/4)O(3)thin films, withx= 0, 3 and 12 mol% La, were studied by in situ synchrotron X-ray diffraction under direct (DC) and alternating (AC) electric fields, with AC frequencies covering more than four orders of magnitude. The Bragg reflections for thin films with low lanthanum concentration exhibit a double-peak structure, indicating two contributions, whereas thin films with 12% La possess a well-defined Bragg peak with a single component. In addition, built-in electric fields are revealed for low La concentrations, while they are absent for thin films with 12% of La. For static and low frequency AC electric fields, all lanthanum-modified lead zirconate titanate thin films exhibit butterfly loops, whereas linear piezoelectric behavior is found for AC frequencies larger than 1 Hz.



subject category

Materials Science


Cornelius, TW; Mocuta, C; Escoubas, S; Lima, LRM; Araujo, EB; Kholkin, AL; Thomas, O

our authors


This work was supported by the Fundacao de Amparo a Pesquisa do Estado de Sao Paulo-FAPESP (Project: 2017/13769-1); Conselho Nacional de Desenvolvimento Cientifico e Tecnologico-CNPq (Grant: 304604/2015-1 and Project No. 400677/2014-8); and Coordenacao de Aperfeicoamento de Pessoal de Nivel Superior-CAPES (CAPES-PRINT Project: 88881.310513/2018-01 and CAPES-COFECUB Project No. 801-14).

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