Education Nizhny Novgorod State University, Russia B.Sc./M.Sc. 1991 Radiophysics and Electronics (Summa Cum Laude) Dresden University of Technology, Germany, Ph.D. 2000, Materials Science (Magna Cum Laude) Professional Experience
2016 – present Principal Researcher, CICECO-Aveiro Institute of Materials, Department of Physics, University of Aveiro, Aveiro, Portugal 2009–2016 Research Assistant Professor, Joint Faculty, Oak Ridge National Laboratory/University of Tennessee, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory and Department of Physics and Astronomy, University of Tennessee, Knoxville, TN, USA 2006–2009 Research Associate, Duke University, Durham, NC, USA 2003–2006 Post Doctoral Fellow, Georgetown University , Washington, DC, USA 2001–2003 Post Doctoral Research Associate, University of Maryland College Park, MD, USA 1997–2001 Scientific Employee, Dresden University of Technology, Germany 1991–1997 Junior Research Scientist, Institute of Applied Physics / Institute for Physics of Microstructures, Russian Academy of Sciences, Russia
Professional and Synergistic Activities Referee for Nature Nanotechnology, Physical Review Letters, Physical Review B, ACS Nano, Applied Physics Letters, and other journals. Honors and Awards
2017 Tan Chin Tuan Exchange Fellowship in Engineering, Nanyang Technological University, Singapore European Materials Research Society (E-MRS) Graduate Student Award (1998). Research Synopsis
- Application and development of various scanning probe microscopy imaging modalities for nanoscale functional characterization of materials.
- Near-field scanning microwave microscopy. We apply and develop near-field scanning microwave microscopy to study local electrical properties of a broad class of material: dielectrics, semiconductors, two-dimensional conductors, including in-situ imaging in fluids.
- Physics of nanoscale phase transitions and heat transport
- Materials for information storage
- Materials for energy storage and conversion
- In-situ Scanning Probe Microscopy of Complex Oxides. In-situ UHV scanning probe microscopy techniques are used to study surfaces of complex oxide thin films grown by Pulsed Laser Deposition / Laser MBE.
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Selective patterning of out-of-plane piezoelectricity in MoTe2 via focused ion beamSeol, D; Kim, S; Jang, WS; Jin, Y; Kang, S; Kim, S; Won, D; Lee, C; Kim, YM; Lee, J; Yang, H; Jeong, MS; Belianinov, A; Tselev, A; Somnath, S; Smith, CR; Ovchinnikova, OS; Balke, N; Kim, Y 2021, NANO ENERGY, 79,
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Local electronic transport across probe/ionic conductor interface in scanning probe microscopyRomanyuk, KN; Alikin, DO; Slautin, BN; Tselev, A; Shur, VY; Kholkin, AL 2021, ULTRAMICROSCOPY, 220,
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Statics and dynamics of ferroelectric domains in molecular multiaxial ferroelectric (Me3NOH)(2)[KCo(CN)(6)]Xu, WJ; Romanyuk, K; Zeng, Y; Ushakov, A; Shur, V; Tselev, A; Zhang, WX; Chen, XM; Kholkin, A; Rocha, J 2021, JOURNAL OF MATERIALS CHEMISTRY C, 9, 33, 10741-10748.
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Multiferroic properties of barium strontium titanate ceramics doped with gadolinium and ironEs'kov, AV; Anokhin, AS; Pakhomov, OV; Semenov, AA; Fadeev, E; Dedyk, A; Kholkin, A; Tselev, A; Baranov, IV; Lahderanta, E 2021, FERROELECTRICS, 574, 1, 109-114.
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Tunable Microwave Conductance of Nanodomains in Ferroelectric PbZr0.2Ti0.8O3 Thin FilmBurns, S. R.; Tselev, A.; Ievlev, A. V.; Agar, J. C.; Martin, L. W.; Kalinin, S. V.; Sando, D.; Maksymovych, P. 2021, ADVANCED ELECTRONIC MATERIALS,
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Exploring Charged Defects in Ferroelectrics by the Switching Spectroscopy Piezoresponse Force MicroscopyAlikin, D.; Abramov, A.; Turygin, A.; Ievlev, A.; Pryakhina, V.; Karpinsky, D.; Hu, Q.; Jin, L.; Shur, V.; Tselev, A.; Kholkin 2021, SMALL METHODS,
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Probing Electrified Liquid–Solid Interfaces with Scanning Electron MicroscopyH.Guo, A.Yulaev, E.Strelcov, A.Tselev, Ch.Arble, A.E.Vladar, J.S.Villarrubia, A.Kolmakov 2020, ACS Applied Materials & Interfaces,
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Nanoscale Mapping of the Double Layer Potential at the Graphene- Electrolyte InterfaceStrelcov, E; Arble, C; Guo, HX; Hoskins, BD; Yulaev, A; Vlassiouk, IV; Zhitenev, NB; Tselev, A; Kolmakov, A 2020, NANO LETTERS, 20, 2, 1336-1344.
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Tracking ion intercalation into layered Ti3C2 MXene films across length scalesGao, Q; Sun, WW; Ilani-Kashkouli, P; Tselev, A; Kent, PRC; Kabengi, N; Naguib, M; Alhabeb, M; Tsai, WY; Baddorf, AP; Huang, JS; Jesse, S; Gogotsi, Y; Balke, N 2020, ENERGY & ENVIRONMENTAL SCIENCE, 13, 8, 2549-2558.
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Near-Field Microwave Microscopy: Subsurface Imaging for In Situ CharacterizationTselev, A 2020, IEEE MICROWAVE MAGAZINE, 21, 10, 72-86.
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Local Electromechanical Response in Doped Ceria: Rigorous Analysis of the Phase and AmplitudeAlikin, DO; Slautin, BN; Ushakov, AD; Shur, VY; Mishuk, E; Lubomirsky, I; Tselev, A; Kholkin, AL 2020, IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 27, 5, 1478-1485.
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Piezoresponse amplitude and phase quantified for electromechanical characterizationNeumayer, SM; Saremi, S; Martin, LW; Collins, L; Tselev, A; Jesse, S; Kalinin, SV; Balke, N 2020, JOURNAL OF APPLIED PHYSICS, 128, 17,
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Giant negative electrostriction and dielectric tunability in a van der Waals layered ferroelectricNeumayer, SM; Eliseev, EA; Susner, MA; Tselev, A; Rodriguez, BJ; Brehm, JA; Pantelides, ST; Panchapakesan, G; Jesse, S; Kalinin, SV; McGuire, MA; Morozovska, AN; Maksymovych, P; Balke, N 2019, PHYSICAL REVIEW MATERIALS, 3, 2,
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Learning from Imperfections: Predicting Structure and Thermodynamics from Atomic Imaging of FluctuationsVlcek, L; Ziatdinov, M; Maksov, A; Tselev, A; Baddorf, AP; Kalinin, SV; Vasudevan, RK 2019, ACS NANO, 13, 1, 718-727.
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Correlative Confocal Raman and Scanning Probe Microscopy in the Ionically Active Particles of LiMn2O4 CathodesAlikin, D; Slautin, B; Abramov, A; Rosato, D; Shur, V; Tselev, A; Kholkin, A 2019, MATERIALS, 12, 9,
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Landau-Ginzburg-Devonshire Theory for domain wall conduction and observation of microwave conduction of domain wallsA. Tselev, A. V. Ievlev, R. Vasudevan, S. V. Kalinin, P. Maksymovych, and A. Morozovska In Dennis Meier, Jan Seidel, Marty Gregg, and Ramamoorthy Ramesh (Eds.), Domain Walls : From Fundamental Properties to Nanotechnology Concepts 2020, Oxford, United Kingdom : Oxford University Press.
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Nanoscale ferroelectric switching: A method to inject and study non-equilibrium domain walls A.V. Ievlev, A. Tselev, R. Vasudevan, S.V. Kalinin, A. Morozovska, and P. Maksymovych In Dennis Meier, Jan Seidel, Marty Gregg, and Ramamoorthy Ramesh (Eds.), Domain Walls: From Fundamental Properties to Nanotechnology Concepts 2020, 245 Oxford, United Kingdom: Oxford University Press.
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Functional material properties of oxide thin films probed by atomic force microscopy on the nanoscaleN.Balke, A.Tselev In Nini Pryds, Vincenzo Esposito (Eds.), Metal Oxide-Based Thin Film Structures 2018, 181-201. Elsevier.
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