Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale

abstract

Piezoresponse force microscopy (PFM) is a powerful method widely used for nanoscale studies of the electromechanical coupling effect in various materials systems. Here, we review recent progress in this field that demonstrates great potential of PFM for the investigation of static and dynamic properties of ferroelectric domains, nanofabrication and lithography, local functional control, and structural imaging in a variety of inorganic and organic materials, including piezoelectrics, semiconductors, polymers, biomolecules, and biological systems. Future pathways for PFM application in high-density data storage, nanofabrication, and spectroscopy are discussed.

keywords

SCANNING PROBE MICROSCOPY; NONLINEAR DIELECTRIC MICROSCOPY; FERROELECTRIC DATA-STORAGE; THIN-FILMS; SINGLE-CRYSTALS; ULTRAHIGH DENSITY; LOCAL REACTIVITY; POLARIZATION; SURFACES; NANOSTRUCTURES

subject category

Materials Science; Physics

authors

Bonnell, DA; Kalinin, SV; Kholkin, AL; Gruverman, A

our authors

acknowledgements

SVK acknowledges support from the division of Scientific User Facilities, DOE, BES. ALK is grateful to the Fundacao para a Ciencia e a Technologia (Portugal) for the financial support within national projects PTDC/FIS/81442/2006 and PTDC/CTM 73030/2006.

Share this project:

Related Publications

We use cookies for marketing activities and to offer you a better experience. By clicking “Accept Cookies” you agree with our cookie policy. Read about how we use cookies by clicking "Privacy and Cookie Policy".