Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale
authors Bonnell, DA; Kalinin, SV; Kholkin, AL; Gruverman, A
nationality International
journal MRS BULLETIN
keywords SCANNING PROBE MICROSCOPY; NONLINEAR DIELECTRIC MICROSCOPY; FERROELECTRIC DATA-STORAGE; THIN-FILMS; SINGLE-CRYSTALS; ULTRAHIGH DENSITY; LOCAL REACTIVITY; POLARIZATION; SURFACES; NANOSTRUCTURES
abstract Piezoresponse force microscopy (PFM) is a powerful method widely used for nanoscale studies of the electromechanical coupling effect in various materials systems. Here, we review recent progress in this field that demonstrates great potential of PFM for the investigation of static and dynamic properties of ferroelectric domains, nanofabrication and lithography, local functional control, and structural imaging in a variety of inorganic and organic materials, including piezoelectrics, semiconductors, polymers, biomolecules, and biological systems. Future pathways for PFM application in high-density data storage, nanofabrication, and spectroscopy are discussed.
publisher CAMBRIDGE UNIV PRESS
issn 0883-7694
year published 2009
volume 34
issue 9
beginning page 648
ending page 657
digital object identifier (doi) 10.1557/mrs2009.176
web of science category Materials Science, Multidisciplinary; Physics, Applied
subject category Materials Science; Physics
unique article identifier WOS:000269768100016
  ciceco authors
  impact metrics
journal analysis (jcr 2019):
journal impact factor 5.061
5 year journal impact factor 5.347
category normalized journal impact factor percentile 79.521
dimensions (citation analysis):
altmetrics (social interaction):



 


Sponsors

1suponsers_list_ciceco.jpg