Dielectric behavior of PLZT x/80/20 ferroelectric ceramics

abstract

PLZT x/80/20 (x=6, 8, 10 at%) ferroelectric ceramics were prepared by conventional oxide mixture method. X-ray difraction analysis show pure perovskite phases. The dielectric properties were analyzed in a wide frequency and temperature ranges, specially around the transition temperature, taking into account the incorporation of the lanthanum into the lattice. A relaxor behavior with diffuse phase transition was observed for all compositions.

keywords

RHOMBOHEDRAL PB(ZR1-XTIX)O-3 CERAMICS; RELAXOR FERROELECTRICS; LANTHANUM MODIFICATION; RELAXATION

subject category

Materials Science; Physics

authors

Garcia, O; Pelaiz, A; Calderon, F; Amorin, H

Groups

Share this project:

Related Publications

We use cookies for marketing activities and to offer you a better experience. By clicking “Accept Cookies” you agree with our cookie policy. Read about how we use cookies by clicking "Privacy and Cookie Policy".