Enhancement of local piezoelectric properties of a perforated ferroelectric thin film visualized via piezoresponse force microscopy

abstract

The local piezoresponse in a Ba0.8Sr0.2TiO3 epitaxial ferroelectric film perforated by cylindrical channels has been investigated experimentally by means of piezoresponse force microscopy (PFM). A large enhancement of the effective values for both lateral and vertical components of piezoelectric tensor was experimentally detected in the perforated film as compared to non-perforated structure-by a factor of 8 for the lateral and by a factor 2 for the vertical piezoresponse. This result is consistent with the previously reported enhancement of the optical second harmonic generation over perforated films observed in macroscopic experiments. We assume that a possible mechanism for the increased PFM response is due to reduction of stress and clamping in the film imposed by the substrate. The obtained insight is critical for understanding nanoscale piezo- and ferroelectric responses in photonic crystals fabricated by focused ion beam milling.

keywords

PERMITTIVITY; TUNABILITY; RECOVERY; DAMAGE

subject category

Physics

authors

Ivanov, MS; Sherstyuk, NE; Mishina, ED; Khomchenko, VA; Tselev, A; Mukhortov, VM; Paixao, JA; Kholkin, AL

our authors

acknowledgements

MSI is grateful to the FCT for financial support through the project 'MATIS-Materiais e Tecnologias Industriais Sustentaveis (CENTRO-01-0145-FEDER-000014). NES and EDM express their gratitude to the Russian Ministry of Education and Science (Grant No. 14.Z50.31.0034 and the State Task No. 3.1923.2017/4.6) for supporting this study. VAK is grateful to FCT for financial support through the FCT Investigator Programme (project IF/00819/2014/CP1223/CT0011). AT and ALK acknowledge CICECO-Aveiro Institute of Materials (Ref. FCT UID/CTM/50011/2013) financed by national funds through the FCT/MEC and, when applicable, co-financed by FEDER under the PT2020 Partnership Agreement Part of this work has been performed on the equipment of Center for collective use 'Electronics' (MIREA).

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